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8/27/2008 12:33:03 PM
Keithley Instruments Receives Industry Award for Semiconductor Measurement System

Keithley Instruments, Inc., a leader in solutions for emerging measurement needs, announces that it has been awarded the prestigious Editor's Choice Best Product Award from Semiconductor International magazine for its Model 4200-CVU Semiconductor Measurement System, which is used to make fast and easy C-V (Capacitance-Voltage) measurements. The annual awards "find and reward the products created by companies that deliver the level of excellence needed to succeed" in the semiconductor industry, according to the magazine.

"C-V measurements are becoming a critical part of research and development in the semiconductor industry," said Mark Hoersten, Keithley vice president business development. "Keithley's Model 4200-CVU is a fast and easy measurement instrument that is vital for product developers and researchers facing the challenges of characterizing new semiconductor materials for next-generation electronic devices such as smart phones, laptops, and other electronic devices."

The awards were presented at a special ceremony on July 16th during the SEMICON West trade show in San Francisco.

With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our products solve emerging measurement needs in production testing, process monitoring, product development, and research. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of precision measurement technology and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.

Other Headlines from Keithley Instruments ...
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 - Keithley Instruments Receives Industry Award for Semiconductor Measurement System

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